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辐射环境是目前存在的最恶劣环境,在此环境下,几乎所有的电子系统的可靠性都要受到程度不同的影响。因此,研究电子系统和电子器件在核辐射环境下产生的效应是可靠性研究的一个组成部分,应引起武器系统研制者的重视。本讲座请中国可靠性协会理事、抗辐照专业组副组长、高级工程师宋钦岐同志主讲,全部内容共分六讲,即第一讲:辐照效应;第二讲:r射线和r脉冲产生的效应;第三讲:电子系统和电子器件的电磁脉冲效应;第四讲:电子元器件抗辐照效应能力;第五讲:电子器件抗辐射加固技术;第六讲:辐照效应的模拟试验。
The radiant environment is the harshest environment present, in which the reliability of almost all electronic systems is affected to varying degrees. Therefore, studying the effects of electronic systems and electronic devices under nuclear radiation environment is an integral part of reliability research and should attract the attention of weapon system developers. This lecture invites the director of China Reliability Association, the deputy leader of anti-radiation professional group, senior engineer Song Qinqi speeches, the whole content is divided into six parts, namely the first talk: Irradiation effect; Lecture 2: r-ray and r pulse generation Lecture 3: Electromagnetic pulse effects of electronic systems and electronic devices; Lecture 4: The ability of anti-radiation effects of electronic components; Lecture 5: Radiation hardening technology of electronic devices; Lecture 6: Simulation of radiation effects test.