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用XPS测量了分散在碳箔载体上的金属钴和氧化钴的钴内层电子结合能和俄歇电子动能。结果表明随着它们在载体上的分散性增加,内层电子结合能向高结合能方向位移,俄歇电子动能向低动能方向位移。借助于原子终态弛豫和初态电子组态效应对这种位移的机理进行了讨论。分散在碳箔载体上的氧化钴的例子表明,出现能量位移的分散性的上限大约是一个单层。
The electron binding energies and Auger electron kinetic energies of the cobalt and cobalt oxides dispersed on the carbon-carbon carrier were measured by XPS. The results show that Auger kinetic energy shifts to low kinetic energy with the increase of their dispersibility on the support and the binding energy of the inner layer to the high binding energy. The mechanism of this shift is discussed with the help of atomic final relaxation and initial state configuration. The example of cobalt oxide dispersed on a carbon foil carrier shows that the upper limit of the dispersibility at which energy displacement occurs is about a single layer.