论文部分内容阅读
本文介绍分析CMOS锁定失效现象的一种方法——模拟法,并举实例说明.提出了一般电路的抗锁简化模型,并叙述了具体测试方法.如何寻找锁定失效的薄弱环节以及在电路上的应用效果。
This paper introduces a method to analyze CMOS lock failure phenomenon-simulation method, and gives an example to illustrate.A simplified model of anti-lock for general circuit is proposed, and the specific test methods are described.How to find the weak link of lock failure and its application on the circuit effect.