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本文介绍将单片机应用于表面粗糙度测量仪,该仪器首次试制成功,能进行国标提出的基本与附加参数的测量。经标准样板测试对比,满足设计要求。
This article describes the application of single-chip surface roughness measuring instrument, the first successful trial of the instrument, the national standard can be submitted to the basic and additional parameters of the measurement. The standard sample test comparison to meet the design requirements.