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所谓光学薄膜的光谱显示,就是把研制样品的光谱特性显示在示波器上,在膜层制备过程中显示出样品光谱特性的形成与变化过程。从而可以直观地控制、制备膜层并直接观测样品的光谱特性。本项技术可用于光学薄膜研究,它既可以控制薄膜的厚度,又可同时观测薄膜的光谱特性,也可用于类似研究、控制和观测光谱特性的其它科技领域。一、原理本项研究的基本原理与一般分光光度计的原理是一致的。但是分光光度计不能用于研究和控制样品光谱持性的连续变化,所以分光光度计就不能用来控制样品光谱特性的产生。本项研究的目的在于在样品的生产过程中能有效地直观地控制和观测样品所要求的光谱特性。
The so-called optical film spectroscopy shows that the spectral characteristics of the developed sample are displayed on the oscilloscope, and the formation and variation of the spectral characteristics of the sample are shown during the preparation of the film. Thus, it is possible to intuitively control and prepare the film layer and directly observe the spectral characteristics of the sample. The technology can be used for optical thin film research, it can control the thickness of the film, but also observe the spectral characteristics of the film can also be used for similar research, control and observation of spectral properties of other science and technology. First, the principle The basic principles of this study is consistent with the principle of general spectrophotometer. However, spectrophotometers can not be used to study and control the continuous changes in sample spectral properties, so spectrophotometers can not be used to control the spectral characteristics of the sample. The purpose of this study is to effectively and intuitively control and observe the required spectral characteristics of a sample during its production.