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前言随着科学技术和工农业生产的飞跃发展,对各种材料的要求越来越高。为了给改进材料的性能和发展新的材料提供科学依据,人们正在利用各种不同的手段进行研究。显微技术是材料科学研究上的一种行之有效的方法。光学显微技术和一般透射电子显微镜技术多年来在这一研究领域中发挥了很大的作用,至今仍然是有力的工具。但是事物总是一分为二的,任何一种强有力的工具都有其一定的局限性。光学显微镜和一般透射电子显微镜的缺点分别是:分辨率低、景深小或者是样品制备手续复杂等,它们仅能提供样品表面的二维图像,所以观察的对象及其内容受到一定限制。近十多年来飞速发展起来的扫描电子显微镜,具有高分辨率、大景深、视野变化范围大,以及能直接对样品进行无损观察、并能迅速提供三维图像等优点。因此,扫描电子显微镜可
Preface With the rapid development of science and technology and industrial and agricultural production, the requirements for various materials are getting higher and higher. In order to provide a scientific basis for improving the performance of materials and developing new materials, various means are being used for research. Microscopy is an effective method of material science research. Optical microscopy and general transmission electron microscopy have played a large part in this area of research for many years and are still powerful tools to this day. But things are always divided into two, any kind of powerful tools have their own limitations. The shortcomings of the optical microscope and the general transmission electron microscope are: low resolution, small depth of field or complex sample preparation procedures, which can only provide two-dimensional images of the surface of the sample, so the objects to be observed and their contents are limited. Nearly a decade of rapid development of scanning electron microscopy, with high resolution, large depth of field, wide field of view changes, as well as direct non-destructive observation of the sample, and can quickly provide the advantages of three-dimensional images. Therefore, scanning electron microscope can be