metal-oxide相关论文
The resistive random access memory(RRAM) device has been widely studied due to its excellent memory characteristics and ......
给出了薄膜气敏材料性能的测试结果:存在最佳灵敏度膜厚l *( l *≈1500?);动态特性;膜越薄响应越快;存在最佳掺杂( CeO2)量x%,x的取值范围为......

