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在本工作中,用电镜法、介电损耗法和微波光导法研究了铜离子的掺杂对于卤化银乳剂微晶体的掺杂效应。试验结果表明,铜离子的掺杂使卤化银乳剂微晶体的颗粒变小,使微晶体的介电损耗峰向高频方向稍微移动0.3对数单位。使微晶体的光电导急剧地降低。实验证明,铜离子吸附在卤化银乳剂微晶体的表面,起着深电子陷阱的作用,是导致铜离子的掺杂使乳剂的感光度降低的主要原因。
In this work, the doping effects of copper ion doping on the silver halide emulsion microcrystals were studied by using electron microscopy, dielectric loss method and microwave photoconduction method. The experimental results show that the doping of copper ions makes the grains of the silver halide emulsion microcrystal smaller and the dielectric loss peak of the microcrystal slightly shifted to 0.3 logarithm in the high frequency direction. The photoconductivity of microcrystals is drastically reduced. Experiments show that the adsorption of copper ions on the surface of silver halide emulsion microcrystals plays a role of deep electron trap, which is the main reason that copper ions doping reduce the sensitivity of emulsion.