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目的 研究病变侧脑亚低温对脑缺血再灌流损伤梗塞体积、 Ｎ Ｏ 的影响确定病变侧亚低温的疗效， 探讨机理。方法 应用可反馈控温半导体致冷块对大鼠局灶脑缺血模型病变侧降温至３２ ～３３ ℃研究持续缺血及再灌流损伤的保护作用及有关因素的影响。结果 持续缺血１０ 分钟低温组及缺血４０ 分钟再灌流并低温组梗塞体积均小于常温对照组。亚低温组 Ｎ Ｏ 含量明显低于常温对照组。结论 病变侧亚低温对脑缺血再灌流损伤在一定时间窗内有明显保护作用， 而亚低温使 Ｎ Ｏ 产生减少可能是其脑保护作用的部分机制。
Objective To study the effect of lesion lateral cerebralhigh temperature on infarct volume and N O after focal cerebral ischemia-reperfusion injury and to determine the effect and mechanism of mild hypothermia. Methods The effect of temperature-controlled semiconducting cooling blocks on the lesion side of rats with focal cerebral ischemia and the protective effects of hypothermic and reperfusion injury and its related factors were studied. Results The infarct volumes in the hypothermia group and the hypothermia group were both lower than those in the normal temperature group. The content of N O in hypothermia group was significantly lower than that in normal temperature group. Conclusion Mild hypothermia on the lesion side has a significant protective effect on cerebral ischemia-reperfusion injury in a certain time window. However, hypothermia may reduce N O production and may be part of the brain protective mechanism.