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前言扫频技术这几年在我国发展很快。用扫频测试微波电子器件和元件的参数,显示了连续快速和直观的优点。微波测试是生产中的重要环节。过去所采用的传统方法——点测法效率低,不能全面反映微波器件的质量指标。随着微波电子器件朝着宽频带、长寿命、高可靠的方面发展,就要求在整个频带内对微波电子器件的参数作连续、快速、直观的测量,那种传统的点测法已不能满足现在生产的需要。因而,两厂都希望采用扫频测试方法,以改变微
Foreword Sweep frequency technology in recent years in our country developed rapidly. Testing the parameters of microwave electronics and components with sweeps shows the advantage of continuous quickness and visualization. Microwave testing is an important part of production. The traditional method used in the past - point method is inefficient, can not fully reflect the microwave device quality indicators. With the development of microwave electronic devices toward broadband, long life and high reliability, continuous, rapid and intuitive measurement of the parameters of microwave electronic devices in the entire frequency band is required, and the conventional point measurement can not satisfy Now the need for production. Therefore, both plants want to use swept frequency test method to change the micro