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引言电子探针首先需测量出半定量成分K值,然后对K值进行定量修正计算,求得元素的含量C。常用的修正法ZAF法,即C=ZAFK。本文叙述了如何获得正确的K值。一、数据的正确测量 1.标样和试样的正确制备 K值是试样和标样X射线强度的比值。要测准两种强度,首先制备合格的试样和标样。(1)样品要有一定的规格。标样的测量面积为2～4 mm,圆柱形试样为φ7～8mm,方形为5×10mm,高(厚)为5～10 mm。(2)样品表面要平坦、光滑、清洁。(3)表面要有良好的导电性。(4)标样纯度应大于99.9％。(5)化合物标样要给出准确的化学式,稳定性要好、密度性要高,应为块状结晶体。(6)合成标样要给出元素的精确含量,成分要均匀。
Introduction Electron probe first need to measure the semi-quantitative component K value, and then the value of K quantitative correction calculation, the content of the element C. Commonly used method of correction ZAF, C = ZAFK. This article describes how to get the correct K value. First, the correct measurement of data 1. Correct preparation of standard samples and samples K value is the ratio of sample and standard X-ray intensity. To test both strength, first prepare qualified samples and standards. (1) The sample must have certain specifications. The standard measurement area is 2 to 4 mm, the cylindrical specimen is 7 to 8 mm, the square is 5 × 10 mm, and the height is 5 to 10 mm. (2) The sample surface should be smooth, smooth and clean. (3) the surface should have good conductivity. (4) standard purity should be greater than 99.9%. (5) compound standard to give accurate chemical formula, stability is better, the density should be high, should be massive crystals. (6) Synthesis of standard samples to give the exact content of elements, ingredients should be uniform.