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高功率微波(HPM)器件在强电磁场作用下的击穿是限制HPM系统功率容量的主要因素之一,是HPM技术进步的瓶颈和国际性的技术挑战。本文开展了纳秒脉冲宽度、吉瓦高功率微波传输通道内击穿发光诊断实验,通过纳秒级响应的四分幅ICCD相机和光电倍增管研究了等离子体可见光和X射线发射的时间及空间发展规律。实验发现HPM通道在传输纳秒微波脉冲时有大量可见光,可能的原因是HPM源的乏电子束轰击收集极的金属表面轫致辐射连续谱的光子在波导内多次反射的结果。通过光电倍增管探测了微波源X射线幅度分布,确认了收集极存在较高能量X射线的结果。
Breakdown of high power microwave (HPM) devices under strong electromagnetic fields is one of the major factors that limit the power capacity of HPM systems. It is also a bottleneck of HPM technological progress and an international technical challenge. In this paper, a diagnostic experiment of breakdown light emission in nanosecond pulse width and high wattage power microwave transmission channel was carried out. The time and space of plasma visible light and X-ray emission were studied by nanosecond-response quadrant ICCD camera and photomultiplier tube Development Law. It is found that the HPM channel has a large amount of visible light during the transmission of nanosecond microwave pulses. The possible reason is that the HPM source’s electron beams bombard the metal surface of the collector, resulting in multiple reflections of the continuous spectrum of photon in the waveguide. Through the photomultiplier tube to detect the microwave source X-ray amplitude distribution, confirmed the collector there is a higher energy X-ray results.