通过以有序的多孔氧化铝为模板，利用交流电在孔中沉积金属铜，并以此作为ＳＥＲＳ活性基底。原子力显微镜（ＡＦＭ）研究了氧化铝溶解过程中铜纳米线形貌，共焦显微拉曼则研究表面吸附ＳＣＮ的ＳＥＲＳ光谱的变化。结果表明：铜纳米线表面ＳＥＲＳ强度和纳米金属在表面直立的高度有关；而其频率和直立的高度无关。ＳＣＮ吸附在纳米线上比普通电化学粗糙的电极表面ＳＥＲＳ强度高，说明纳米线（点）有望成为一种活性高，稳定性好的ＳＥＲＳ基底。 By using ordered porous alumina as a template, metallic copper is deposited in the pores by using an alternating current as a SERS active substrate. Atomic force microscopy (AFM) studied the morphology of copper nanowires during alumina dissolution and confocal microscopy Raman spectroscopy to investigate the change in SERS spectra of surface-adsorbed SCN. The results show that the intensity of SERS on the surface of copper nanowires is related to the height of the nanowires on the surface, while the frequency is independent of the height of the nanowires. SCN adsorption on the nanowires electrode surface roughness than ordinary electrochemical SERS intensity, indicating that the nanowires (dots) is expected to become a high activity, good stability SERS substrate.