在增加测试范围时,减少产品的测试时间是大多数测试工程师的目标。首先考虑通过改进测试系统而使测试时间尽量缩短几秒。1995年我曾帮客户改进了一台用于测试晶片上的模拟IC的测试系统。改进后的系统,不但使测试时间从20秒降到30秒,而且也增加了测试范围。你也可用这些技术改进你的测试系统。 In increasing the scope of the test, reducing the test time of the product is the goal of most test engineers. First consider improving the test system to make the test time as short as possible a few seconds. In 1995 I helped my client improve a test system for testing analog ICs on a chip. The improved system, not only to reduce the test time from 20 seconds to 30 seconds, but also increased the scope of the test. You can also use these techniques to improve your test system.