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Nano Indenter Ⅱ纳米显微力学探针是我室1994年从美国 Nano Instru-ments公司引起的,目前是国内唯一一台。它是一种新型的材料微区力学性能检测系统,它使我们能够得到距材料表面几纳米至几十微米厚或亚微米范围的力学性能。从而使我们对材料微区力学性能的研究成为可能。
Nano Indenter Ⅱ nano-micro-mechanical probe is my room from the United States in 1994 Nano Instru-ments caused the company, is currently the only one. It is a new type of material micromechanical testing system that enables us to obtain mechanical properties ranging from a few nanometers up to tens of micrometers thick or submicron from the surface of a material. So that we can study the mechanical properties of material microdomains.