众所周知，在扫描电镜Ｘ射线能谱分析中，杂散Ｘ射线的存在，将影响能谱分析的精度。上海永新彩管公司使用的仪器系进口的ＳＸ－４０ＡＳＥＭ和ＰＧＴ－ＩＭＩＸＥＤＳ，在分析样品时，经常发现有杂散Ｃｕ峰干扰。严重影响了测试工作的开展。为此，作者就杂散Ｘ射线的产生... As we all know, in the scanning electron microscopy X-ray energy spectrum analysis, the presence of stray X-ray will affect the accuracy of energy spectrum analysis. The instruments used by Shanghai Yongxin CPT Co., Ltd. are imported SX-40ASEM and PGT-IMIXEDS. When analyzing samples, they often find spurious Cu peak interference. Seriously affected the test work. To this end, the author on stray X-ray generation ...