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本文研究了锡锑中间层的结构及降低钛基二氧化铅电极界面电阻的机理。掺Sb的SnO_2中间层显著改善了钛基二氧化铅电极的稳定性,提高了使用寿命。x射线衍射分析结果表明,中间层的主要成份是SnO_2与SbOx的固溶体,同时在Ti/SnO_2界面上还有量Ti_4Sb、Ti_3Sb Ti_3Sn和(SbTi_(1.2))O。因而提出了电极结构模型的假设,并且解释了中间层对降低界面电阻,改进β—PbO_2/SnO_2与Ti/SnO_2之间结合强度的有益作用。
In this paper, the structure of tin-antimony interlayer and the mechanism of reducing the interfacial resistance of titanium-based lead dioxide electrode were studied. Sb-doped SnO 2 interlayer significantly improves the stability of the Ti-based lead dioxide electrode and improves the service life. The results of X-ray diffraction analysis show that the main component of the intermediate layer is the solid solution of SnO 2 and SbO x, and the amount of Ti 4 Sb, Ti 3 Sb Ti 3 Sn and (SbTi 1.2) O at the Ti / SnO 2 interface. Therefore, the hypothesis of the electrode structure model is proposed and the beneficial effect of the intermediate layer on reducing the interfacial resistance and improving the bonding strength between β-PbO 2 / SnO 2 and Ti / SnO 2 is explained.