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在深入分析电化学腐蚀原理的基础上,发现了一种提高针尖的尖锐程度的新方法,即:利用下端腐蚀方法得到了比传统的上端腐蚀方法更尖锐的针尖.通过对腐蚀电压、腐蚀溶液浓度、切断时间的研究和分析,总结出下端腐蚀法制备纳米级STM探针的最佳综合条件;并通过对前人方案的修改和完善,研制了一套自动控制切断电路装置,该电路装置可以任意设置切断条件,以此得到不同粗细的针尖;最后将据此制作的纳米级针尖成功地应用于Unisoku-STM仪器的扫描,得到了清晰、稳定的原子级分辨Bi(0001)图像.
On the basis of further analysis of the electrochemical corrosion theory, a new method to improve the sharpness of the tip is found, ie, the tip of the tip is sharper than that of the traditional upper-edge etching method by using the lower-edge etching method.By analyzing the corrosion voltage, Concentration and cut-off time, and concluded the best synthetic conditions for preparation of nano-scale STM probe by the bottom-end etching method. Through the modification and improvement of the predecessor’s scheme, a set of automatic control cutoff circuit device was developed. The circuit device The cutting conditions can be set arbitrarily to obtain the different thickness of the needle tip. Finally, the nanometer needle tip fabricated by this method is successfully applied to the scanning of Unisoku-STM instrument, and a clear and stable atomic resolution Bi (0001) image is obtained.