一、概述恒定加速度试验是用来确定恒定加速度对微电子器件的影响,目的是显示在冲击试验和振动试验时不一定能检测出的结构和机械类型的缺陷。也是通过高应力来测定微电子器件封装、内部金属化和引线系统、芯片或基板的焊接以及器件其他部件的机械强度极限值,检测并剔除其结构部件中的机械强度低于标称值 I. Overview Constant acceleration test is used to determine the impact of constant acceleration on microelectronic devices, the purpose is to show that the impact test and vibration test may not be able to detect the structure and type of mechanical defects. It also measures the mechanical strength limits of microelectronic device packages, internal metallization and lead systems, soldering of chips or substrates, and other parts of the device through high stress, detecting and removing the mechanical strength of structural components below the nominal value