序言 X射线衍射貌相术是研究近完整晶体中点阵缺陷的一种新方法。许多研究者已研究过在位错、堆垛层错处衍射衬度的原因。对于略微畸变的晶体也已拟定了X射线衍射理论,而且X射线貌相术已用于研究晶体中长程应变场。可是,X射线貌相术对于短程应变程似平具有低的灵敏度,点缺陷它们的聚集和小位错环已不能利用X射线貌相技术来成象。为了探测这些小缺陷,某些研究者已作了异常透射的强度测量。但是,当这些小缺陷的尺度和浓度都很小时,它们对于异常透射的影响似乎是微不足道的。本文的目的是描述一种新方法,以得到用常规的X射线貌相技术不能显示的小缺陷的运动学象。 Introduction X-ray diffraction topography is a new method to investigate lattice defects in near complete crystals. Many researchers have studied the causes of diffraction contrast at dislocations and stacking faults. X-ray diffraction theory has also been developed for slightly distorted crystals, and X-ray topography has been used to study the mid-long strain field in crystals. However, X-ray topography has a low sensitivity to short-range strain gages and their point-defect aggregation and minor dislocation loops can no longer be imaged using X-ray topography. In order to detect these small defects, some researchers have made abnormal transmission intensity measurements. However, when the scales and concentrations of these small defects are small, their effect on the anomalous transmission seems insignificant. The purpose of this paper is to describe a new method to get the kinematics of small defects that can not be displayed by conventional X-ray topography.