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在2005年HL-2A实验中,我们首次采用两通道硅漂移探测器(Silicon Drift Detector,SDD)软X射线能谱系统对等离子体电子温度进行了测量。文章详细地介绍了SDD软X射线能谱测量系统的原理、设计和初次运行,给出了HL-2A电子温度的测量结果。结果表明,SDD非常适合于HL-2A电子温度测量,为在HL-2A上建立多通道SDD阵列测量电子温度分布奠定了坚实的基础。
For the first time in the 2005 HL-2A experiment, we measured the plasma electron temperature using a two-channel soft-energy X-ray spectroscopy system using a silicon drift detector (SDD). The principle, design and initial operation of SDD soft X-ray energy spectrum measurement system are introduced in detail. The measurement results of HL-2A electron temperature are given. The results show that SDD is very suitable for the measurement of HL-2A electron temperature, which lays a solid foundation for the establishment of multi-channel SDD array on HL-2A for measuring the electronic temperature distribution.