前言在微波反射测试中,目前我们熟悉的比较完善的方法是扫频测试技术,它的出现使测试工作变得简单和快速。但是,它只能给出频域里待测元件总的等效结果,而不能鉴别出不连续点的性质和位置。可是对元件设计来说,我们不光要知道元件的性能是否符合要求,更重要的是要知道引起元件不合格的原因、位置及改进办法,这些信息对宽带元件设计更加重要。这一任务扫频是无法完成的,而时域反射计却能完满地完成,它的出现使微波元件得到 Preface In the microwave reflection test, the most perfect method that we are familiar with now is the frequency sweep test technique. Its appearance makes the test work simple and fast. However, it can only give the total equivalent results of the components under test in the frequency domain, but can not identify the nature and location of discontinuities. However, for component design, we not only need to know whether the component performance meets the requirement, but more importantly, we should know the reason, location and improvement of component failure, which is more important for the design of broadband components. This task is impossible to sweep the sweep, but the time domain reflectometer can be completed satisfactorily, it appears to microwave components