论文部分内容阅读
采用浸渍法制备了La_2O_3、TiO_2、ZrO_2以单层状态分散在SiO_2、Al_2O_3上的改性载体。用XPS求得它们的最大单层分散阈值为:0.22gLa_2O_3/100m ̄2SiO_2,0.27gLa_2O_3/100m ̄2,0.04gTiO_2/100m ̄2SiO_2,0.036gTiO_2/100m ̄2Al_2O_3,0.07gZrO_2/100m ̄2SiO_2,0.08gZrO_2/100m ̄2Al_2O_3。La_2O_3可以完全铺满SiO_2、Al_2O_3载体表面,而TiO_2、ZrO_2仅仅覆盖SiO_2(Al_2O_3)表面的40%及50%。在以涂层氧化物为载体的Pd催化剂制备过程中,通过XPS的氩离子刻蚀技术,确定了Pd分布在以SiO_2(Al_2O_3)为骨架的涂层氧化物的表面上,与La_2O_3、TiO_2、ZrO_2在SiO_2(Al_2O_3)骨架上的分布基本一致,没有进入SiO_2(Al_2O_3)晶格内部。XRD衍射图则说明在Pd催化剂配制过程中,TiO_2、ZrO_2、La_2O_3没有形成结晶相,也没有与SiO_2(Al_2O_3)发生反应,仍以单层分散形式存在?
La 2 O 3, TiO 2 and ZrO 2 were prepared by impregnation method. The modified supports were dispersed in SiO 2 and Al 2 O 3 on a single layer. The maximum monolayer dispersion thresholds obtained by XPS were 0.22gLa_2O_3 / 100m ~ 2SiO_2, 0.27gLa_2O_3 / 100m_2, 0.04gTiO_2 / 100m ~ 2SiO_2, 0.036gTiO_2 / 100m ~ 2Al_2O_3 and 0.07gZrO_2 / 100m ~ 2SiO_2, 0.08gZrO_2 / 100m ~ 2Al_2O_3. La 2 O 3 can completely cover the surface of SiO 2 and Al 2 O 3 supports, while TiO 2 and ZrO 2 only cover 40% and 50% of the surface of SiO 2 (Al 2 O 3). During the preparation of Pd catalyst with the oxide coating as carrier, Pd was deposited on the surface of SiO_2 (Al_2O_3) -coated oxide by XPS argon ion etching, and the results showed that Pd reacted with La_2O_3, TiO_2, The distribution of ZrO_2 on the SiO_2 (Al_2O_3) framework is basically the same and does not enter the interior of the SiO_2 (Al_2O_3) crystal lattice. XRD diffraction pattern shows that in the process of Pd catalyst preparation, TiO_2, ZrO_2 and La_2O_3 do not form crystalline phase, and do not react with SiO_2 (Al_2O_3).