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基于固体与分子经验电子理论(EET),计算了Al-22%Si合金熔体相价电子结构参数,研究了铝硅合金熔体基元键络对温度(能量)变化的敏感性及其对组织形态的影响.结果表明,低过热铝硅合金熔体中nA值较大的Si-Si团簇为过共晶铝硅合金初生硅形核提供了核心,对其周围的Al-Si团簇产生强烈的“类拖曳”效应;熔体温度的变化较明显地影响了该核心键络的稳定性,从而影响了组织形态;脉冲电场作用于合金熔体后,不可恢复地改变了Si-Si团簇键络稳定性,从而对合金凝固组织形态起到变质作用,施加电脉冲的能量越高,Si-Si团簇越不稳定,电脉冲孕育效果越显著.
Based on the empirical electron theory of solids and molecules (EET), the electronic structure parameters of Al-22% Si alloy melts were calculated and their sensitivity to the change of temperature (energy) was studied. The results show that Si-Si clusters with a large nA value in the overheated Al-Si alloy melt provide the core for the primary silicon nuclei in the hypereutectic Al-Si alloy. The Al-Si clusters Which caused a strong “drag-like” effect. The change of melt temperature obviously affected the stability of the core bond and thus affected the morphology of the microstructure. After the pulse electric field applied to the alloy melt, the Si -Si cluster bond stability, and thus the morphology of alloy solidified tissue metamorphism, the higher the energy applied electrical pulse, Si-Si clusters more unstable, the more significant effect of electrical pulse inoculation.