我国科技人员经过数年联合攻关,自主开发成功我国首台大型集成电路测试系统。不久前,这一系统通过了国家技术鉴定。由北京自动测试技术研究所、国营767厂、中科院计算所联合开发的“BC3190大型集成电路测试系统”在国内首次采用了90年代国际先进的每测试通道定时——事件驱动结构;在周期、通道、测试台、软件等子系统的研制和开发中,形成了我国独立自主版权,取得了每测试通道定时- After several years of joint scientific research, China's scientific and technological personnel independently developed China's first large-scale integrated circuit test system. Not long ago, this system passed the national technical appraisal. The “BC3190 Large Integrated Circuit Test System” jointly developed by Beijing Institute of Automatic Test Technology, State-owned 767 Factory and CAS Institute of Computing Technology was the first time China adopted the international advanced timing-event driven structure for each test channel in the 1990s. During the period , Channels, test benches, software and other subsystems of the research and development, formed our own independent copyright, made every test channel timing -