混合信号器件与电路板的测试仍然是一昂贵和费时的过程,因为必须同时具备数字和模拟测试设备。模拟测试存在的问题是,测试过程不象数字测试那样容易自动进行:必须为每一个新的被测器件(DUT)的每一个不同参数开发测试程序。 随着标准测试方法的发展,比如JTAG以及现在的IEEE1149,数字测试已取得进展,并基本上着眼于 Testing mixed-signal devices and boards remains an expensive and time-consuming process, as both digital and analog test equipment must be available. The problem with analog testing is that testing is not as easy as testing digital tests: Test programs must be developed for each different parameter of each new device under test (DUT). As standard test methods have evolved, such as JTAG and now IEEE1149, digital testing has progressed and is basically focused on