可靠性是影响发光二极管应用的一个重要因素。对1 W大功率发光二极管分批在不同电流及不同结温下进行试验,分析了电流和结温对功率型发光二极管寿命的影响,应用应力加速模型推测在不同电流或结温条件下发光二极管的寿命,同时研究了试验过程中发光二极管的光电性能的变化,探索其失效机理,为功率型发光二极管的应用提供参考。 Reliability is one of the important factors that affect the application of light-emitting diodes. The 1 W high-power LEDs were tested in batches under different current and different junction temperatures. The effects of current and junction temperature on the lifetime of power LEDs were analyzed. The stress-accelerated model was used to predict the effect of different current or junction temperature on the performance of light-emitting diodes The life span of the light-emitting diode (LED) during the test was studied, and the failure mechanism was explored to provide a reference for the application of the power LED.