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1.0 引言本方案的目的在于检查、最佳化、提高和确定用铝作金属化可输出28瓦的 TA8694晶体管和用金作金属化及管芯载体封装的可输出40瓦的 RCAT A8777晶体管的失效前平均时间。为了提高失效前平均时间,使晶体管性能最佳化,仔细分析了器件失效模式和机理,随后并进行了校准测量。朝着使失效前平均时间达到10~0器件小时的最终目标而努力。2.0 方案的目的为了用有效而及时的方法达到此目的,方案工作分成二个独立的任务,下面称为第一阶段和第二阶段。
1.0 INTRODUCTION The purpose of this proposal is to examine, optimize, improve, and determine the failure of metallization of aluminum to produce 28 watts of TA8694 transistor and 40 watts of outputable RCAT A8777 transistor in gold and die carrier packaging Average time before. To improve the average before failure, transistor performance optimization, careful analysis of the device failure modes and mechanisms, followed by calibration measurements. Efforts are being made toward the goal of achieving an average of 10 to 0 device hours before failure. 2.0 Purpose of the program In order to achieve this goal in an effective and timely manner, the program work is divided into two separate tasks, referred to below as phases I and II.