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随着半导体器件的发展,许多超高频管先后研制成功,工作频率高达十几到几千兆赫。如何设计晶体管工作寿命试验线路,这是摆在可靠性与稳定性方面必不可少的工作,这里不仅要考虑高稳定度的直流供电问题,还要考虑消除晶体管器件的自激问题。因此,这项工作就不象处理低频管寿命试验线路那样简单了。 晶体管产生高频振荡以后,加在晶体管上不仅有直流功耗,同时还有高频功耗,轻者得不到可靠的数据,无法对器件做出正确判断;重者则烧毁晶体管。 这里我们只介绍如何防止高频管自激振荡。至于静态工作点稳定问题,这里不再陈述。要着重指出的是直流工作点的稳定程度直接影
With the development of semiconductor devices, many ultra-high frequency tubes have been successfully developed, operating frequency up to a dozen to several gigahertz. How to design the transistor working life test circuit, which is placed in the reliability and stability of the work, here not only to consider the high stability of the DC power supply problem, but also consider eliminating self-excitation transistor devices. Therefore, this work is not as simple as dealing with the burette life test circuit. Transistor high-frequency oscillation, plus the transistor not only has DC power consumption, along with high-frequency power consumption, the light can not get reliable data, can not make the correct judgment of the device; the heavier burned the transistor. Here we only introduce how to prevent high-frequency tube self-oscillation. As for the problem of the stability of static working point, it will not be stated here. It is important to point out that the DC operating point of the direct impact of the degree of stability