一、微处理器测试方法评述集成电路测试常常采用两类方法:结构测试与功能测试。结构测试以检查电路故障为目的,通常把电路分割成许多单元(如逻辑门),检查各个单元及其相互连线上的各种故障。S-A-O、S-A-1是常见的物理故障逻辑表现的模型。这类测试的基本原理是敏化故障。几种 First, the microprocessor test method reviews IC testing are often used two types of methods: structural testing and functional testing. Structural Testing To check for a circuit fault, the circuit is usually divided into many cells (such as logic gates) to examine various faults on the cells and their interconnections. S-A-O, S-A-1 is a common model of logical manifestation of physical failures. The basic principle of this type of test is to sensitize the fault. Several