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理论分析了LED的电流/电压(I/V)特性与PN结结温的关系,揭示了温度函数的串联电阻项对I/V曲线的影响,并应用这一影响提出了一种基于串联电阻测量LED结温的方法。该方法只需多点记录LED工作状态的电流、电压值,对数据进行模型拟合就可以得出LED的结温,测试仪器要求低,测量过程简单,可与LED老化工艺同步进行,是一种简单、有效的批量检测LED结温的方法。利用该方法测量了6组LED灯具,测量结果与传统正向电压法的结果具有较高的一致性,证实了该方法的可行性。
The relationship between LED current / voltage (I / V) characteristics and junction temperature of PN junction is theoretically analyzed. The influence of series resistance of temperature function on I / V curve is revealed. Based on this effect, Method of measuring LED junction temperature. The method only needs to record current and voltage values of the LED working state by multiple points, and the LED junction temperature can be obtained by fitting the data to the data, the requirements of the testing instrument are low, the measuring process is simple, and the LED aging process can be performed synchronously A Simple, Efficient Batch Detection Method for LED Junction Temperature. Six sets of LED lamps were measured by this method. The measured results are in good agreement with the results of the traditional forward voltage method. The feasibility of the method is verified.