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低温光致发光微计算机测试系统(PL-PC)是应用IBM-PC微计算机和先进的具有软件的数据采集系统(Keithley DAS Series 500)等配接到低温光致发光测量设备上,对固体材料的光致发光进行测试.特别是对Ⅲ-V族,Ⅱ-Ⅵ族半导体化合物的测试显著提高了效率和精度。实现了理想的测量控制、数据采集、数据处理和管理。对数据采集采用光编码器等作直接同步控制,采集精度从10?-0.04?可调,采集灵敏度<1mV,对测试结果(数据、谱线、计算结果、测试条件等)可以显示、记录、打印、存储等多种方式任选输出,全部过程在程序控制下进行。应用程序使用BASIC和Soft 500写成,采用“菜单”方式,模块结构,使用方便,灵活、稳定、可靠.
Low-temperature photoluminescence microcomputer test system (PL-PC) is the application of IBM-PC microcomputer and advanced data acquisition system with software (Keithley DAS Series 500) and other devices connected to the low-temperature photoluminescence measurement equipment, solid materials Of the photoluminescence test.Especially the group III-V, Ⅱ-Ⅵ semiconductor test significantly improve the efficiency and accuracy. Achieved the ideal measurement control, data acquisition, data processing and management. The data acquisition using optical encoder for direct synchronization control, acquisition accuracy from 10? -0.04? Adjustable acquisition sensitivity of <1mV, the test results (data, spectral lines, calculation results, test conditions, etc.) can be displayed, Print, store and other methods of optional output, the entire process under the control of the program. The use of BASIC and Soft 500 applications written, using “menu” mode, the module structure, easy to use, flexible, stable and reliable.