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受河北省科委、教委的委托,由我院电气工程系器件教研室研制的“砷化镓外延片均匀性研究”于1990年11月24日在河北工学院通过技术鉴定。院长张闽副教授、科研处处长刘志清副教授参加了鉴定会。来自南开大学、中国科技大学研究生院、机电部1446所、华光电子器件厂、天津第六半导体厂、宣化七○一厂等单位的近20位专家、教授和高级工程技术人员参加了会议。该项科研是我院电系器件教研室的袁炳辉讲师、系副主任付濬副教授、器件教研室副主任王林海副教授共同研制的。鉴定委员会对所提供的技术资料进行了认真的审查和评议一致认为:
Commissioned by the Hebei Provincial Science Commission, the Education Commission commissioned by the Department of Electrical Engineering Department of Devices developed by the “gallium arsenide epitaxial uniformity study” in November 24, 1990 in Hebei Institute of Technology passed the technical appraisal. Dean Zhang Min associate professor, research director Liu Zhiqing associate professor attended the appraisal meeting. Nearly 20 experts, professors and senior engineers and technicians from Nankai University, Graduate School of China University of Science and Technology, Ministry of Mechanical and Electrical Engineering 1446, Huaguang Electronic Devices Factory, Tianjin No.6 Semiconductor Factory and Xuanhua 701 Factory participated in the meeting. The research is the Yuan Binghui Lecturer of Department of Electrical Equipment Department, Associate Professor Jun Fu, Associate Professor, Associate Director of Device Teaching and Research Office, Associate Professor Wang Linhai jointly developed. Accreditation Committee for the technical information provided by the careful review and comment agreed that: