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功能纳米器件中组成材料间的电荷转移输运过程对于器件中的物理化学过程以及由此引发的器件功能会有重大影响,因此,深入理解器件工作过程中的电子/离子行为机理对于优化器件功能以及进一步开发纳米材料的应用潜力具有重要意义.传统场效应晶体管对于纳米材料的电输运测量表征反映了载流子在整个器件中的统计行为,但难以检测电荷具体的转移输运过程.同时,由于纳米材料的尺寸和分散性,基于纳米材料的场效应晶体管面临着制备困难、电极/纳米材料接触复杂和制作成本高等问题.因此,本课题组发展了介电力显微术(dielectric force microscopy,DFM)方法并实现了对纳米材料电学性质的无接触、高空间分辨率和快速表征.本文介绍了介电力显微术的基本原理,列举了其在探究一维纳米材料、纳米颗粒以及有机半导体薄膜电学性质上的一些应用实例.这些实例验证了介电力显微术对纳米材料电学性质的表征能力,并展现了这一技术在纳米材料物理化学性质和纳米器件功能研究上的广阔前景.
The charge-transfer process between the constituent materials in a functional nanodevice can have a significant impact on the physico-chemical processes in the device and the resulting device function. Therefore, understanding the electron / ion behavior mechanism during device operation is very important for optimizing the device function As well as to further develop the potential of nanomaterials.The characterization of the electrical transport of traditional field-effect transistors for nanomaterials reflects the statistical behavior of charge carriers throughout the device, but it is difficult to detect the specific charge transport process. Due to the size and dispersion of nanomaterials, the field-effect transistors based on nanomaterials are faced with problems of preparation difficulties, complex contact of the electrodes / nanomaterials and high production costs, etc. Therefore, the group developed the dielectric force microscopy , DFM) method and achieve the non-contact, high spatial resolution and rapid characterization of the electrical properties of nanomaterials.In this paper, the basic principle of dielectric microscopy is introduced, and its application in the exploration of one-dimensional nanomaterials, nanoparticles and organic Some examples of the electrical properties of semiconductor thin films. These examples Permit the dielectric power microscopy to characterize the ability of the electrical properties of nanomaterials, and revealing a broad future this technique functionally Physicochemical properties of nanomaterials and nanodevices.