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当被测微波谐振腔的品质因数Q值大于一干时,一般要求备有贵重精密的仪器设备。本文提出了使用一般仪表测量高Q值的措施,并给出了实验结果。通常测量Q值的方法多建立在谐振腔半功率点带宽测量的基础上。这种方法要求按下式计算有载品质因数,Q_L即Q_L=(f_o)╱(△f)。当Q_L值很大时,例如在x波段的Q_L=4000,谐振频率f_o=10吉赫,则△f=2.5兆赫。为了保证Q_L有5%的测量精度,就要求频率测量的地对精度优于62.5千赫,相对精度优于6.25×10~(-6)。一般仪表很难满足这些要求。
When the measured quality factor of the microwave resonator Q value is greater than a dry, generally require the preparation of precious precision instruments and equipment. In this paper, measures to measure high Q using general instruments are presented and the experimental results are given. The method that usually measures Q value mostly builds on the half-power point bandwidth of the cavity to measure. This method requires that the load factor be calculated as Q_L = (f_o) / (Δf). When the Q_L value is large, for example Q_L = 4000 in the x-band, the resonance frequency f_o = 10 GHz, then Δf = 2.5 MHz. In order to ensure that Q_L has a 5% measurement accuracy, it is required that the accuracy of the frequency measurement is better than 62.5 kHz and the relative accuracy is better than 6.25 × 10 -6. General instrument is difficult to meet these requirements.