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目前,国、内外大型外径千分尺的固定测头均采用可换测杆型式,使测量范围扩大至100毫米,如图1。但有的可换测杆没有定位槽,如图2(α)。这样,每次更换可测杆时,因装的方位不一样,从而引起千分尺两测量面不平行度发生变化,有时甚至出现超差。因为大型千分尺两测量面的不平行,主要由两项偏差合成的:一项是由于活动测杆测量平面与其回转轴线的不垂直引起的,如图3(α);另一项是由于活动测杆回转轴线对固定
Currently, the national and international large-diameter micrometer fixed probes are used to replace the measuring rod type, the measurement range expanded to 100 mm, shown in Figure 1. But some can not change the test rod positioning groove, shown in Figure 2 (α). In this way, each time the test rod can be changed, because of the different orientation of the device, which causes the micrometer measuring surface of non-parallelism change, and sometimes even out of tolerance. Because of the non-parallelism of the two measuring surfaces of a large micrometer, it is mainly composed of two deviations: one is due to the non-perpendicularity between the measuring plane of the measuring rod and its axis of rotation, as shown in Figure 3 (α); and the other is due to the activity measurement Rod rotation axis fixed