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锡石单矿物中的微痕量元素,用化学方法测定时,由于样品不易分解,难于获得理想的结果。应用光谱法测定,虽具有取样少、多种元素能同时测定等优点,但Sn的强扩散线3262(?)、3175(?)、3034(?)、2840(?)、2706(?)、2661(?)所产生的强背景,给测定某些痕量元素(特别是In、Ge、Nb、Ta、Cc、Ag等)带来很大的困难。我们通过对缓冲剂及电极形状等工作条件的选择,利用分馏效应采用两段曝光的办法,避免了基体元素Sn的干扰影响,
Cassiterite single trace elements in trace minerals, measured by chemical methods, due to the sample is not easy to break down, it is difficult to obtain the desired results. The spectroscopic method has the advantages of less sampling, simultaneous determination of multiple elements, and the like. However, the strong diffusion lines of Sn (3262, 3175, 3034, 2840, 2706, The strong background generated by 2661 (?) Brings great difficulties in the determination of some trace elements, especially In, Ge, Nb, Ta, Cc, Ag and so on. Through the selection of working conditions such as buffer and electrode shape, we use the two-stage exposure method by using the fractionation effect to avoid the interference effect of the matrix element Sn,