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We have successfully employed metal-organic chemical vapor deposition(MOCVD)technique to simultaneously deposit double-sided YBa2Cu3O7-δ(YBCO)films on both sides of Y2O3/yttria-stabilized zirconia(YSZ)/CeO2(YYC)buffered biaxially textured Ni-5 at.%W substrates,which is of great prospect to cut the production cost of YBCO coated conductors.X-ray diffraction analysis revealed that both sides of YBCO film were purely c-axis oriented and highly textured.Theφ-scan of(005)YBCO andφ-scan of(103)YBCO yielded full width at half maximum(FWHM)values of 4.9°and 6.6°for one side of double-sided YBCO film,respectively,as well as 4.4°and 6.4°for the other side.The current transportation measurements performed on such double-sided 500 nm-thickness YBCO films showed the self-field critical current density(Jc)at 77 K of0.6 MA/cm2 and 1.2 MA/cm2,respectively.Further research is in the process of exploring new solution to improve the Jc in practice.
We have successfully employed metal-organic chemical vapor deposition (MOCVD) technique to deposit double-sided YBa2Cu3O7-δ (YBCO) films on both sides of Y2O3 / yttria- stabilized zirconia (YSZ) / CeO2 (YYC) buffered biaxially textured Ni- 5 at.% W substrates, which is of great prospect to cut the production cost of YBCO coated conductors. X-ray diffraction analysis revealed that both sides of YBCO film were purely c-axis oriented and highly textured.Theφ-scan of (005 ) YBCO and φ-scan (103) YBCO yielded full width at half maximum (FWHM) values of 4.9 ° and 6.6 ° for one side of double-sided YBCO film, respectively, as well as 4.4 ° and 6.4 ° for the other side The current transportation measurements performed on such double-sided 500 nm-thickness YBCO films showed the self-field critical current density (Jc) at 77 K of 0.6 MA / cm 2 and 1.2 MA / cm 2, respectively. Further research is in the process of exploring new solution to improve the Jc in practice.