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对于商品涤纶长丝在1克张力下于200,220,240,250℃进行2秒钟热处理。用 Vonk 方法,对小角 x 光散射进行相关函数分析。结果表明,随着处理温度 Ta 的升高,相关函数求得的长周期增大;微纤中晶片沿纤维轴向的厚度稍有增大;晶区完整性程度上升,而晶片厚度分布趋于均一。微纤中非晶区沿纤维轴向尺寸也增大,非晶尺寸的绝对分布趋于分散。由实验结果,讨论了Vonk 方法的适用性。
Polyester commercial filaments were heat-treated at 200, 220, 240, 250 ° C for 2 seconds under 1 gram tension. Using Vonk method, correlation analysis of small angle X-ray scattering was carried out. The results show that with the increase of the processing temperature Ta, the long period obtained by the correlation function increases; the thickness of the wafer along the fiber axis slightly increases in the microfiber; the degree of the integrity of the crystal area increases while the thickness distribution of the wafer tends to Uniform. The amorphous regions in the microfibers also increase along the axial dimension of the fiber, and the absolute distribution of the amorphous size tends to disperse. From the experimental results, the applicability of the Vonk method is discussed.