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几年来,找们利用不同的探测器系统和样品环境,获得了各种样品(地质、冶金和陶瓷等方面的样品)的良好的背散射电子图像。因为我们测得的结果近似于,有时甚至优于Robinson和Nikel(1979)报道的结果,所以,我们希望介绍这些可供选择的技术。我们特别希望纠正“Robinson和Nikel(1979)的测试结果只是他们的成像系统所特有的”这样一种印象。我们还将介绍,如何根据背散射电子图像来得到更进一步的信息,特别是Robinson和Nikel(1979)没有论及的关于矿物成份及其所占比例等方面的信息问题。
For several years now, they have used various detector systems and sample environments to obtain good backscattered electron images of various samples (samples in geology, metallurgy and ceramics). Because the results we measured are similar to, and sometimes even superior to those reported by Robinson and Nikel (1979), we would like to introduce these alternative technologies. We particularly want to correct the “Robinson and Nikel (1979) test results are only their imaging system unique” such an impression. We will also describe how to obtain further information based on backscattered electron images, especially the information on mineral composition and its proportions that Robinson and Nikel (1979) did not discuss.