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单粒子效应产生的软错误是影响航天电子系统可靠性的主要因素之一。对其进行建模是研究单粒子效应机理和电路加固技术的有效方法。介绍了深亚微米及以下工艺中影响模型准确性的几种效应机制,包括脉冲展宽机制、电荷共享机制和重汇聚机制等。重点分析了单粒子瞬态、单粒子翻转的产生模型和单粒子瞬态的传播模型。阐述了基于重离子和脉冲激光的模型验证方法。最后,分析了单粒子效应随特征尺寸的变化趋势,并提出了未来单粒子效应建模技术的发展方向。
Soft errors caused by single-particle effects are one of the main factors that affect the reliability of aerospace electronic systems. Modeling them is an effective way to study the single-particle effect mechanism and circuit reinforcement techniques. Several effect mechanisms that affect the model accuracy in deep sub-micron and below are introduced, including pulse broadening mechanism, charge sharing mechanism and re-aggregation mechanism. The single-particle transient, single-particle inversion generation model and single-particle transient propagation model are mainly analyzed. The model verification method based on heavy ion and pulsed laser is described. Finally, the trend of the single-particle effect with the feature size is analyzed and the development direction of single-particle effect modeling technology is proposed.