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X射线衍射硅粉末标样CSS是以区熔单晶硅为原料,经球磨后过400目筛而制成。其纯度大于99.9％,平均颗粒度约6微米,小于10微米的颗粒约占73％(重量)。使用该标样能获得线形平滑、强度高、分辨率佳,重复性好的衍射图谱,从而能校正衍射仪的分辨率,确定峰位,并能进行定量相分析。本标样与美国国家标准局NBS出售的标准参考物质SRM-640以及日本理学电机公司的Rigaku硅标样相当。
X-ray diffraction silicon powder standard sample of CSS is the melting zone of silicon as raw material, after milling through a 400 mesh sieve and made. It has a purity of greater than 99.9%, an average particle size of about 6 microns, and particles of less than 10 microns make up about 73% by weight. The standard can be used to obtain a diffraction pattern with smooth line, high intensity, good resolution and good repeatability, so as to correct the resolution of the diffractometer, determine the peak position, and perform quantitative phase analysis. This standard is comparable to the standard reference material SRM-640 sold by the National Bureau of Standards of the United States of America and the Rigaku silicon standard of Japan’s Rigaku Corporation.