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为理解和评估超高速碰撞产生等离子体及其对航天器逻辑芯片的电磁干扰效应,进行二级轻气炮强冲击加载实验模拟超高速撞击;利用郎缪尔三探针诊断系统对弹丸撞击2A12铝板产生等离子体的电子温度和电子密度在给定位置处进行诊断测量,建立逻辑芯片信号采集系统对给定位置处逻辑芯片遭受干扰进行监测分析。结果表明,撞击速度在2.5~3.5km/s范围时均能产生等离子体,等离子体电子温度和电子密度均随撞击速度而增加,其中电子密度与撞击速度呈指数关系。超高速碰撞产生等离子体对逻辑芯片运行状态的干扰主要表现为三种形式,分别是传输信号瞬态中断而后恢复、输出逻辑关系短暂失真和逻辑门失效。
In order to understand and evaluate the plasma generated by hypervelocity impact and its electromagnetic interference effect on the logic chip of spacecraft, the second-level light-air gun strong impact loading experiment was used to simulate hypervelocity impact; the projectile impact 2A12 The electronic temperature and the electron density of the plasma generated by the aluminum plate are used for diagnosis and measurement at a given position, and a logic chip signal acquisition system is established to monitor and analyze the interference of the logic chip at a given position. The results show that the plasma can be generated when the impact velocity is in the range of 2.5 ~ 3.5km / s. The plasma electron temperature and electron density increase with the impact velocity, and the electron density exponentially with the impact velocity. The interference of plasma generated by hypervelocity impact on the operating status of the logic chip is mainly manifested in three forms, namely, the transient signal is interrupted and then recovered, the output logic transient distortion and the logic gate failure.