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LET is one of the important parameters in the ground single event effects (SEE) simulation experiment results, the accuracy will directly affect the accuracy of evaluation of radiation ability of space-borne microelectronic devices. In past SEE experiments
LET is one of the important parameters in the ground single event effects (SEE) simulation experiment results, the accuracy will directly affect the accuracy of evaluation of radiation ability of space-borne microelectronic devices. In past SEE experiments