用表面粗糙度评定方法和分形几何方法，结合原子力／摩擦力显微图象的特点，编制了包括Ｒａ，Ｒｑ，Ｓｍ，Ｓ，λａ，λｑ及高度分布、承载率曲线、相关函数、功率谱和分形维数等参数的图象分析与测量的ＦＯＲＴＲＡＮ程序；用ＳＴＲ－１８０和ＳＴＲ－１０００标样作了高度标定，对国产Ｎａｔｕｒｅ磁带和进口Ｓｏｎｙ磁带的原子力／摩擦力显微图象进行了分析测量．结果表明：Ｎａｔｕｒｅ磁带的粗糙度和粒度均比Ｓｏｎｙ磁带的大；微摩擦力与表面轮廓及表面轮廓斜率之间均有良好的对应关系． By using surface roughness evaluation method and fractal geometry method, combined with the characteristics of atomic force / friction microscopic image, a series of data including Ra, Rq, Sm, S, λa, λq and height distribution, bearing capacity curve, correlation function, And fractal dimensions and other parameters of the FORTRAN image analysis and measurement procedures; STR-180 and STR-1000 standard was highly calibrated, made of Nature tape and imported Sony tape atomic force / friction microscopy images were Analytical measurement. The results show that Nature tapes are both larger in roughness and size than Sony tapes; there is a good correspondence between microform friction and surface profile and surface profile slope.