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对汉芯造假事件处理的不了了之,说明我们处理科研不端行为依然不够公开透明,导致造假成本太低2006年5月12日,上海交通大学向新华社记者通报,国家有关部门调查显示,该校微电子学院院长、“长江学者”陈进在负责研制“汉芯”系列芯片过程中存在严重的造假和欺骗行为。陈进被撤销各项职务和学术头衔,科技部、教育部、国家发展和改革委员会等部委与其解除科研合同,并追缴各项费用。
On the handling of counterfeiting incidents can not Hanban, indicating that our handling of scientific misconduct is still not enough openness and transparency, resulting in fraud costs are too low On May 12, 2006, Shanghai Jiao Tong University, Xinhua News Agency reporter informed that the relevant state departments survey, Chen Jin, president of the school's microelectronics institute and “Chang Jiang Scholar”, was responsible for faking and cheating in the development of the “Hankuang” chip series. Chen Jin was withdrawn from various positions and academic titles, and ministries and commissions such as the Ministry of Science and Technology, the Ministry of Education and the National Development and Reform Commission lifted the scientific research contracts with them and recovered the costs.