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频率源的远端相位噪声功率谱密度S(f)(此处指的是付氐频率f>6kHz的相噪功率谱密度),是一个重要的性能指标。由于在这f段的S(f)值甚小,故必须用“测试低限”很低的测试设备。用一般鑑相法制成的设备可能达到这一“测试低限”,但却存在以下缺点: (1)需用高频宽帶可变移相等部件;(2)要求待测源与设备内部的本振源严格同频。这些缺点导致了设备的应用范围受到限制,并使其结构变得比较复杂,因而调节、使用不够方便。本文提出了一种新的方法,它具有与上述鑑相法制成的设备同等级的“测试低限”和测试精度(置信区间),却又基本上克服了其缺点。文中阐述和讨论了新方法的基本原理、置信区间、测试低限和设计的重点。利用按新方法制就的设备,对多种频率源进行了实测,所得结果与其说明书中所述相符。
The far-end phase noise power spectral density S (f) of the frequency source (referred to here as the phase noise power spectral density of f> 6 kHz) is an important performance measure. Since the value of S (f) in this section f is very small, a test equipment with a “low test limit” must be used. Devices made using the general phase-contrast method may reach this “low test limit,” but suffer from the following disadvantages: (1) high-bandwidth, variable-phase-equal components are required; (2) local oscillator Strict source with the same frequency. These shortcomings led to the application of the device is limited, and make its structure becomes more complicated, so regulation, use is not easy enough. In this paper, a new method is proposed, which has the same level of “test low limit” and test accuracy (confidence interval) as the above-mentioned device made by the phase discrimination method, but basically overcomes the shortcoming. The article describes and discusses the basic principles of the new method, confidence intervals, test limits and design priorities. A variety of frequency sources were measured using equipment made using the new method and the results obtained were consistent with those described in the specification.