对于铬产品微量杂质元素的光谱定量分析,由于铬光谱线的干扰及其弥散光谱背景的影响,使得一些杂质分析线的选择、灵敏度的提高,都遇到了一定的困难。根据目前对铬产品杂质分析的要求和现有仪器的具体情况,我们采用了光谱纯石墨粉作为缓冲剂,镓作为内标元素,交 Chromium quantitative analysis of trace impurities in the product, due to the interference of chromium spectral lines and the dispersion of the background of the impact of dispersion, making some of the impurity analysis of the choice of the line, the sensitivity increased, have encountered some difficulties. According to the current requirements for the analysis of impurities in chromium products and the specific circumstances of the existing instruments, we used a spectroscopic pure graphite powder as a buffer, gallium as an internal standard element,