Single-walled carbon nanotubes (SWCNTs),due to their outstanding electrical and optical properties,are expected to have extensive applications,such as in transparent conductive films and ultra-small field-effect transistors (FETs).However,those applications can only be best realized with pure metallic or pure semiconducting SWCNTs.Hence,identifying and separating metallic from semiconducting SWCNTs in as-grown samples are crucial.In addition,knowledge of the type of an SWCNT is also important for further exploring its new properties in fundamental science.Here we report employing scanning near-field optical microscopy (SNOM) as a direct and simple method to identify metallic and semiconducting SWCNTs on SiO2/Si substrates.Metallic and semiconducting SWCNTs show distinct near-field optical responses because the metallic tubes support plasmons whereas the semiconducting tubes do not.The reliability of this method is verified using FET testing and Rayleigh scattering spectroscopy.Our result demonstrates that the SNOM technique provides a reliable,simple,noninvasive and in situ method to distinguish between metallic and semiconducting SWCNTs.