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提出了一种新的并行扫描结构。扫描触发器的选择采用ＢＡＬＬＡＳＴ算法。该结构采用译码的方式依次选通每个扫描小组，使得扫描小组中的存储元件并行地控制和观测。测试产生和响应时间比串行扫描法快Ｋ倍（Ｋ为并行度），而硬件耗费比多链扫描法和传统的并行扫描结构小很多。
A new parallel scanning structure is proposed. The choice of scanning flip-flop using BALLAST algorithm. The structure uses decoding to sequentially select each scan group so that the storage elements in the scan group can be controlled and observed in parallel. Test generation and response times K times faster than the serial scan method (K is the degree of parallelism), and the hardware cost is much smaller than the multi-link scanning method and the traditional parallel scan structure.